EBSD 2010
May 5th & 6th, 2010
Advanced methods in EBSD (Electron Backscattered Diffraction)
Technical Programme
András Borbély et al.
Combined X-ray rocking curve and EBSD study of plastically deformed copper single
crystals
Nathalie Bozzolo et al.
Cyril Cayron
Crystallographic tools to study phase transformations by EBSD
Austin Day
David Dingley & Stuart Wright
Automated phase determination through detection of symmetry elements in EBSD patterns.
Lionel Germain et al.
Calculation of high temperature parent orientation maps application to low carbon
steels
Anne-Laure Helbert et al.
Characterization of strained materials: correlation between EBSD investigations
and TEM observations.
Claire Maurice et al.
Towards high angular resolution EBSD : development of new indexation algorithms
Wolfgang Pantleon
Resolving the geometrically necessary dislocation content by conventional EBSD
Edgar Rauch
Orientation and phase mapping on a Transmission Electron Microscope
Carol Trager-Cowan et al.
Electron Channelling Contrast Imaging of Defects in Nitride Semiconductor Thin
Films
Patrick Villechaise
Contribution of EBSD measurements and of SEM in situ mechanical testing to the
analysis of slip activity in metals
Angus Wilkinson
Cross-correlation-based Analysis of EBSD patterns: Mapping Strains, Curvature and GND Distributions
Aimo Winkelmann
Stefan Zaefferer
3D orientation microscopy based on FIB-EBSD tomography: potentials and limits