Master in Microelectronics Technology and Manufacturing Management
Module 1.1 - Production Statistical Management Tools
1.1.1 - Statistical Process Control
Program focus
Define and discuss the different dimensions of quality, quality improvement
methods, the kinds of process variability, the basic SPC problem-solving
tools.
Benefits
This module is about the use of statistical methods for quality control
and improvement. It provides comprehensive coverage of the subject from
basic principles to state-of-art concepts and applications.
The objective is to give the reader a sound understanding of the principles
and the basis for applying them in a variety of situations.
1.1.4 - DOE Statistics
Program focus
This is an introductory module dealing with the design and analysis of experiments.
Define and discuss the different kinds of DOE.
Benefits
This module is about the use of Design of experiments for quality improvement.
It provides comprehensive coverage of the subject from basic principles
to state-of-art concepts and applications.
The objective is to give the reader a sound understanding of the principles
and the basis for applying them in a variety of situations.
1.1.5 - DOE applications
Program focus
This 12-hour course presents the Applications of Design Of Experiment methodology
to Semiconductor’s problems since R&D to Production activities:
principles, matrix choice, modeling, optimization.
Alternation of talks, Software manipulations and practice exercises.
Benefits
At the end of this course, you will be able to apply Design Of Experiment
Methodology to Semiconductor in order to improve products and processes
with a limited number of experiments.