Master in Security of Integrated Systems and Application : Secure your future

Program

Integrated Circuits Test (17.5h)

Marie-Lise Flottes

Synopsis

This formation covers testing of analog and digital electronic systems with very large scale integration (VLSI). It gives essential data on test economics, classical semiconductor defects, simple test pattern coverage, structured design for testability techniques (scan, boundary scan, BIST) for system-on-a-chip design, automatic test equipment (constraints and costs), and selected advanced topics (IDDQ and delay faults testing, design for testability and secure systems).

Timetable

(A session amounts to 13/4 hours.)
Session 1
Introduction (Y. Bertrand)
Session 2
Fault modeling (Y. Bertrand)
Session 3
Automatic test pattern generation and fault simulation (C. Landrault)
Session 4
IDDQ and delay tests (P. Girard)
Session 5
Memory test (A. Virazel)
Sessions 6, 7 and 8
Design-for-testability [DFT] (P. Girard)
Session 9
Analog and mixed-signal test (M. Comte)
Session 10
DFT and secure designs (M.-L. Flottes)

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