Publications de : Esperan PADONOU

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Nombre de documents trouvés : 17

2019

Pré-publication, Document de travail

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Olivier Roustant, Esperan Padonou, Yves Deville, Aloïs Clément, Guillaume Perrin, et al.. Group kernels for Gaussian process metamodels with categorical inputs. 2019. 〈hal-01702607v3〉
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https://hal.archives-ouvertes.fr/hal-01702607/file/groupKernels%20%281%29.pdf BibTex

2017

Communication dans un congrès

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Espéran Padonou, Olivier Roustant. Analyse de sensibilité en domaine circulaire. SFdS 49èmes Journées de Statistique , May 2017, Avignon, France. 2017. 〈emse-01540219〉
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2016

Article dans une revue

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Espéran Padonou, Olivier Roustant. Polar Gaussian Processes and Experimental Designs in Circular Domains. SIAM/ASA Journal on Uncertainty Quantification, ASA, American Statistical Association, 2016, 4 (1), pp.1014 - 1033. 〈10.1137/15M1032740〉. 〈emse-01412189〉
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Communication dans un congrès

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Olivier Roustant, Espéran Padonou. Kriging and Design of Experiments on Circular Domains. The Fourth International Conference on the Interface between Statistics and Engineering 2016 (ICISE2016), Jun 2016, Palerme, Italy. 2016, 〈http://www.cityu.edu.hk/seem/icise2016/index.htm〉. 〈hal-01350664〉
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Thèse

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Esperan Padonou. Statistical Learning on Circular Domains For Advanced Process Control in Microelectronics. Other. Université de Lyon, 2016. English. 〈NNT : 2016LYSEM009〉. 〈tel-01438684v2〉
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https://tel.archives-ouvertes.fr/tel-01438684/file/PADONOU-ESPERAN-diff.pdf BibTex

Pré-publication, Document de travail

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Espéran Padonou, O Roustant. Polar Gaussian Processes and Experimental Designs in Circular Domains. 2016. 〈hal-01119942v4〉
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https://hal.archives-ouvertes.fr/hal-01119942/file/polarGP_HAL.pdf BibTex

2015

Article dans une revue

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Espéran Padonou, Olivier Roustant, Michel Lutz. Robust Monitoring of an Industrial IT System in the Presence of Structural Change. Quality and Reliability Engineering International, Wiley, 2015, 31 (6), pp.Pages 949-962. 〈http://onlinelibrary.wiley.com/〉. 〈10.1002/qre.1651〉. 〈emse-01235063〉
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Communication dans un congrès

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Espéran Padonou, Jakey Blue. Wafer Spatial Pattern Decomposition and Diagnosis Based on Processing Characteristics. 15th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-15, Sep 2015, Prague, Czech Republic. 〈emse-01412221〉
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Espéran Padonou, Olivier Roustant, Jakey Blue, Duverneuil Hugues. Spatial risk assessment on circular domains: Application to wafer profile monitoring. 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), May 2015, Saratoga Springs, United States. IEEE, 〈10.1109/ASMC.2015.7164475〉. 〈emse-01338842〉
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Olivier Roustant, Espéran Padonou. Predicting on circular domains with Gaussian processes. Predicting on circular domains with Gaussian processes, Mar 2015, Dortmund, Germany. 〈https://www.statistik.tu-dortmund.de/sfb823-seminars.html〉. 〈10.1002/qre.1651〉. 〈emse-01235067〉
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2014

Article dans une revue

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Espéran Padonou, Olivier Roustant, Michel Lutz. Robust monitoring of an industrial IT system in the presence of structural change. Quality and Reliability Engineering International, Wiley, 2014. 〈hal-02091598〉
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Communication dans un congrès

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Espéran Padonou, Jakey Blue, Olivier Roustant, Duverneuil Hugues. Response surface approximation for profile monitoring in circular domains. 14th Annual Conference of the European Network for Business and Industrial Statistics ENBIS-14, Sep 2014, Linz, Austria. 〈emse-01412227〉
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2013

Communication dans un congrès

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Espéran Padonou, Jonathan Villot. Estimation of Energy Savings through a Kriging Metamodel. 13th Annual Conference of the European Network for Business and Industrial Statistics (ENBIS-13), Sep 2013, Ankara, Turkey. 2013. 〈emse-00864669〉
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Mireille Batton-Hubert, Mickaël Binois, Espéran Padonou. Inverse modeling to estimate methane surface emission with optimization and reduced models: application of waste landfill plants. 13th Annual Conference of the European Network for Business and Industrial, Sep 2013, Ankara, Turkey. 2013. 〈emse-00849417〉
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Michel Lutz, Espéran Padonou, Olivier Roustant. Implementing statistical methods to improve information system management in a semiconductor industry. European Network for Business and Industrial Statistics (ENBIS), Sep 2013, Ankara, Turkey. 〈hal-02093439〉
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Pré-publication, Document de travail

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Espéran Padonou, Olivier Roustant, Michel Lutz. Robust monitoring of an industrial IT system in presence of structural change. 2013. 〈hal-00790206〉
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https://hal.archives-ouvertes.fr/hal-00790206/file/Robust_HW_structchange.pdf BibTex

2012

Communication dans un congrès

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Espéran Padonou, Olivier Roustant, Michel Lutz. Robust control chart to monitor the information system of semiconductor production plant. European Network for Business and Industrial Statistics (ENBIS), Sep 2012, Ljubljana, Slovenia. 〈hal-02093437〉
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